Course contents

Welcome to the five-day course focused on electromagnetic compatibility (EMC) of integrated circuits (ICs).

  • A vision of the evolution of technologyof the evolution of technology, roadmaps and consequences on EMC of ICs is given as an introduction
  • A set of basic concepts is proposed in the second part, covering specific units, parasitic impedance of interconnects, origin of noise, noise margins, time/frequency conversion and adaptations.
  • The third focus concerns parasitic emission, how to design low emission circuits and how to measure the IC emission using standard IEC 61967 methods. Susceptibility measurement methods (IEC 62132) are also described, with hardware/software techniques to improve immunity to interference.
  • The fourth part is related to modeling approaches for predicting EMC (IEC 62433), based on standards such as IBIS, ICEM and ICIM.
  • The fifth part deals with EMC guidelines for improved emission and immunity to interference. Finally, roadmaps and future challenges including 3D-ICs are briefly reviewed.
  • The world of 3D-ICs and benefits in terms of EMC are outlined in Part six EMC guidelines for improved emission and immunity to interference. Finally, roadmaps and future challenges including 3D-ICs are briefly reviewed.
  • Illustrations of these concepts are made using IC-EMC, a freeware including unique features and tools for efficient EMC simulations of integrated circuits.
  • Afternoons are dedicated to practical sessions including an access to the EMC laboratory of INSA Toulouse, for hands-on experiments of IC emission characterization (according to IEC 61967) and IC immunity characterization (IEC 62 132).

Program details

  • Day 1, Sept 18, 2017
    • Welcome (E. Sicard, A. Boyer, O. Bernad)
    • Context and overview (E. Sicard)
    • Basic concepts (E. Sicard)
    • Illustration of basic concepts using IC-EMC
  • Day 2, Sept 19, 2017
    • Measurement methods (A. Boyer)
    • Group 1: lab – emission measurement methods (1 ohm, Sig int, sniffer, TEM)
    • Group 2: simulation of emission measurement methods (1 ohm, Sig int, TEM, scan)
  • Day 3, Sept 20, 2017
    • Modelling Emission & Immunity of ICs (E. Sicard)
    • Group 2: lab – emission measurement methods
    • Group 1: simulation of emission measurement methods
  • Day 4, Sept 21, 2017
    • EMC guidelines (E. Sicard)
    • Golden Rules for low emission
    • Golden Rules for low susceptibility
    • Group 1: lab – immunity measurement methods
    • Group 2: simulation of immunity
  • Day 5, Sept 22, 2017
    • Group 2: lab – immunity measurement methods
    • Group 1: simulation of immunity
    • Introduction to 3D-IC EMC (E. Sicard)
    • Case study (E. Sicard)
    • Course evaluation Report specifications (PhD students)

    Reference Book

    The course is supported by the book published in July 2017, by South University Press, Toulouse. The book is dedicated to undergraduate, graduate and post-graduate students and engineers in electronic design who want to learn more about EMC at IC level. The content of the book covers the basic notions for learning how to model circuits and their surrounding environment (PCB) with respect to emission, immunity and signal integrity issues. This book is accompanied by the freeware IC-EMC to illustrate theoretical concepts as well as practical case studies. The book also provides a series of exercises.

    Reference Software

    The course is supported by the the freeware IC-EMC (Click here to download) to illustrate theoretical concepts as well as practical case studies related to parasitic emission and susceptibility modeling. Based on 15 years of research, IC-EMC gathers a unique collection of IC models, tools and EMC measurements related to more than 15 IC case studies complied in a user's manual. The software has been developed by Prof. Etienne SICARD and Dr. Alexandre BOYER, INSA-Toulouse, Department of Electrical and Computer Engineering, France.

    IC-EMC needs a SPICE solver such as WinSPICE or LTSPICE for analog simulation.

    The Teachers

    The teachers belong to GEI department of INSA Toulouse.


    Alexandre BOYER

    Senior Lecturer

    Etienne SICARD

    Professor